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Evaluation of the Durability and Reliability of the Power Semiconductor Device for a Hybrid Car’s Motor Driver

Article of Honda R&D Technical Review Vol.12 No.1

Summary

The reliability of the power semiconductor device for a hybrid car’s motor driver was verified by clarifying the relationship between the unit life characteristics and vehicle usage environment in terms of electric current and heat generation temperature. A reliability of 99.915% or more and a shape parameter (m) of 5.5 or more were obtained. Further, an evaluation method for durability and reliability was established.

Reference

(1) Tadashi Ohsawa: Denshi zairyou no handazuke gijyutu, Kogyo Chosakai Publishing Co., Ltd., Tokyo, p.304(1998) (Written in Japanese)

Author (organization or company)

Sadao SHINOHARA(Tochigi R&D Center)、Shuuji KATOU(Tochigi R&D Center)、Hiroaki TAKANOHASHI(Tochigi R&D Center)、Fumio ANRAKU(Tochigi R&D Center)

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